Monday , December 17 2018 Ausdroid » Hardware » Mobiles » Drop testing the new flagships, solid build on both sides


It happens every time there’s a new phone out or very close to being released, some bugger gets hold of the phone and drops it repeatedly until it breaks. This time the team at TechSmartt got their hands on a brand new Samsung Galaxy S5 and compared it to its older sibling, the Galaxy S4. Both phones held up extremely well to the “simulation” tests and required being dropped from a height of about 10 feet before there was any damage that would be detrimental to the functionality of the device.

They also did a similar test on both the HTC One (M7) and HTC One (M8), both phones held up very well even to being dropped from a remarkable height of around 10 feet and the M8 even after being run over by a car. This is certainly a testament to the build quality of HTC phones and the metallic construction of the device.

I’ve been very undecided on which direction to go with the latest flagship phones and my next purchase, while I’m hopeful my patience can hold out for the next Nexus… If I were going to buy a phone today, HTC will be the manufacturer getting my money. The time I’ve spent with both phones has been good, but the experience with the new HTC One (M8) has been more pleasant and the drop tests have sealed the deal.

Do you take much from drop tests? Or is it just an excuse to destroy a brand new phone?

Source: Techsmart YouTube.

Phil Tann   Journalist

Phil is an Android enthusiast who spends most of his time reading up on U.S. Android news so he can get the low down on what could possibly hit Australian shores. Coming from a background in IT & T sales, he’s in the perfect position to give an educated view on hardware and software.

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Seriously, running over the phone with a SUV !! Get real

Joshua Hill
Ausdroid Reader

Drop tests are useful but as no two drops are ever the same suffer from greater variability than benchmarks. Just as benchmarks are useful indicators so too are drop tests but I’d never make a decision solely on that data.


I like the idea of such independently executed drop tests.
A stock device which survives those tests, is one worth looking at buying. If the device takes multiple passes through such tests before it finally fails then it ought to be able to survive the milder treatment a normal user will mete out to it in the course of its life.


But there are too many variables. Neither phone in either test drops and lands the same way. I woukd to see a machine orientated drop/stress test. We all know if something drops the right(wrong) way it’s done. These merely show they survive how they were drop…not that they survive an identical drop

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